
| Stopping (dE/dx), scattering and excitation phenomena for charged particles traversing condensed media |
| Development of novel ion beam analysis techniques using elastic scattering, Particle-Induced X-ray Emission (PIXE) and Nuclear Reaction Analysis (NRA) |
| Characterization of ultrathin oxynitrides and high-κ dielectrics on Si using Medium Energy Ion Scattering (MEIS) in conjunction with NRA |
| Computer simulations for Rutherford Backscattering (RBS), 4He-induced Elastic Recoil Detection (ERD) and Medium Energy Ion Scattering (MEIS) experiments |
| Development of novel ion beam analysis techniques using elastic scattering, Particle-Induced X-ray Emission (PIXE) and Nuclear Reaction Analysis (NRA) |
last update: 8 August 2011