Heng-Yong Nie

I am a research scientist with SSW, which provides technical consultancy in surface analysis to industry clients and academic users, as well as conducts externally-funded research.

As an adjunct research professor, I carry out independent research. With expertise in atomic force microscopy, time-of-flight secondary ion mass spectrometry and surface chemistry, I am active in collaborating with academic and industry researchers in developing surface analytical techniques and molecular engineering of surface with self-assembled monolayers.

		Heng-Yong Nie, Ph.D. Research Scientist, Surface Science Western Adjunct Research Professor, Department of Physics and Astronomy The University of Western Ontario, London, Ontario, Canada Ph.D.: Univ. Tsukuba; M.Sc.: Unniv. Tsukuba; B.Sc.: Univ. Electronic Sci. & Technol.
Home Research Publications Contact		I am a research scientist with SSW, which provides technical consultancy in surface analysis to industry clients and academic users, as well as conducts externally-funded research. As an adjunct research professor, I carry out independent research. With expertise in atomic force microscopy, time-of-flight secondary ion mass spectrometry and surface chemistry, I am active in collaborating with academic and industry researchers in developing surface analytical techniques and molecular engineering of surface with self-assembled monolayers.
		Research Interests: Developing scanning probe microscopy (SPM) techniques for imaging soft materials Applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS) in studies of surface chemistry and biological tissues Self-assembled monolayers (SAMs) and their applicatins in molecular engineering of surface Cross-linking molecular and polymer thin films for surface engineering Selected Publications: H.-Y. Nie, A.R. Taylor, W.M. Lau and D.F. MacFabe Subcellular features revealed on unfixed rat brain sections by phase imaging Analyst 136, 2270-2276 (2011). H.-Y. Nie Revealing different bonding modes of self-assembled octadecylphosphonic acid monolayers on oxides by time-of-flight secondary ion mass spectrometry: silicon vs aluminum Analytical Chemistry 82, pp. 3371-3376 (2010). M. Tencer, H.-Y. Nie and P. Berini Electrochemical differentiation and ToF-SIMS characterization of thiol-coated gold features for (bio)chemical sensor applications Journal of the Electrochemical Society 156, pp. J386-J392 (2009). H.-Y. Nie, J.T. Francis, A.R. Taylor, M.J. Walzak, W.H. Chang, D.F. MacFabe and W.M. Lau Imaging subcellular features of a sectioned rat brain using time-of-flight secondary ion mass spectrometry and scanning probe microscopy Applied Surface Science 255, pp.1079-1083 (2008). H.-Y. Nie, N.S. McIntyre and W.M. Lau Nanolithography of a full-coverage monolayer of octadecylphosphonic acid spin-coated on a Si substrate Applied Physics Letters 90, Article No. 203114 (2007). H.-Y. Nie, M.J. Walzak and N.S. McIntyre Delivering octadecylphosphonic acid self-assembled monolayers onto a Si wafer and other oxide surfaces Journal of Physical Chemistry B 110, pp.21101-21108 (2006). H.-Y. Nie and N.S. McIntyre A simple and effective method of evaluating atomic force microscopy tip performance Langmuir 17, pp.432-436 (2001). H.-Y. Nie, K. Horiuchi, H. Yamauchi and J. Masai Local surface potential measurement of Pd/GaAs contact and anodized aluminum films using scanning probe microscopy Nanotechnology 8, pp.A24-A31 (1997). H.-Y. Nie, M. Motomatsu, W. Mizutani and H. Tokumoto Local elasticity measurement on polymers using atomic force microscopy Thin Solid Films 273, pp.143-148 (1996). H.-Y. Nie and Y. Nannichi Pd-on-GaAs Schottky contact: Its barrier height and response to hydrogen Japanese Journal of Applied Physics 30, pp.906-913 (1991). Updated on July 11, 2011

Research Interests:

Selected Publications: