Scanning probe techniques

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Publication List

    55. M. Tencer, A. Olivieri, B. Tezel, H.-Y. Nie and Pierre Berini
    Chip-scale electrochemical differentiation of SAM-coated gold features using a probe array
    J. Electrochem. Soc. 159, J77-J82 (2012).

    54. L. Zhang, J. Bates, D.H. Chen, H.-Y. Nie and Y.N. Huang
    Investigations of formation of molecular sieve SAPO-34
    J. Phys. Chem. C 115, 22309-22319 (2011).

    53. J. Hua, Z.G. Wang, J. Zhao, J. Zhang, R.Y. Li, H.Y. Nie and X.L. Sun
    A facile approach to synthesize poly(4-vinylpyridine)/multi-walled carbon nanotubes nanocomposites: highly water-dispersible carbon nanotubes decorated with gold nanoparticles
    Colloid Polym. Sci. 289, 783-789 (2011).

    52. H.-Y. Nie, A.R. Taylor, W.M. Lau and D.F. MacFabe
    Subcellular features revealed on unfixed rat brain sections by phase imaging
    Analyst 136, 2270-2276 (2011).

    51. M. Tencer, H.-Y. Nie and P. Berini
    Formation and electrochemical desorption of thiol self-assembled monolayers as studied by ToF-SIMS
    Surf. Interface Anal.43, 993-997 (2011).

    50. Y. Liu, D.-Q. Yang, H.-Y. Nie, W.M. Lau and J. Yang
    Study of a hydrogen-bombardment process for molecular cross-linking within thin films
    J. Chem. Phys. 134, 074704 (2011).

    49. M. Tencer, H.-Y. Nie and P. Berini
    A contact angle and ToF-SIMS study of SAM - thiol interactions on polycrystalline gold
    Appl. Surf. Sci. 257, 4038-4043 (2011).

    48. H.-Y. Nie, A.R. Taylor, J.T. Francis, M.J. Walzak, W.M. Lau and D.F. MacFabe
    Tracing propionic acid infused to rat brain via deuterium tagging - further development of a novel rodent model of autism spectrum disorders
    Surf. Interface Anal. 43, 358-362 (2011).

    47. Y. Liu, K.M. Leung, H.-Y. Nie, W.M. Lau and J. Yang
    A new AFM nanotribology method using a T-shape cantilever with an off-axis tip for friction coefficient measurement with minimized Abbé error
    Tribol. Lett. 41, 313-318 (2011).

    46. H.-Y. Nie
    Revealing different bonding modes of self-assembled octadecylphosphonic acid monolayers on oxides by time-of-flight secondary ion mass spectrometry: silicon vs aluminum
    Anal. Chem. 82, 3371-3376 (2010).

    45. Y. Liu, Q.Q. Guo, H.-Y. Nie, W.M. Lau and J. Yang
    Optimization and calibration of atomic force microscopy sensitivity in terms of tip-sample interactions in high-order dynamic atomic force microscopy
    J. Appl. Phys. 106, 124507 (2009).

    44. M. Tencer, H.-Y. Nie and P. Berini
    Electrochemical differentiation and ToF-SIMS characterization of thiol-coated gold features for (bio)chemical sensor applications
    J. Electrochem. Soc. 156, J386-J392 (2009).

    43. S. Naeem, Y. Liu, H.-Y. Nie, W.M. Lau and J. Yang
    Revisiting AFM force spectroscopy sensitivity for single molecule studies
    J. Appl. Phys. 104, 114504 (2008).

    42. H.-Y. Nie, N.S. McIntyre, W.M. Lau and J.M. Feng
    Optical properties of octadecylphosphonic acid self-assembled monolayer on a silicon wafer
    Thin Solid Films 517, 814-818 (2008).

    41. H.-Y. Nie, J.T. Francis, A.R. Taylor, M.J. Walzak, W.H. Chang, D.F. MacFabe and W.M. Lau
    Imaging subcellular features of a sectioned rat brain using time-of-flight secondary ion mass spectrometry and scanning probe microscopy
    Appl. Surf. Sci. 255, 1079-1083 (2008).

    40. J.T. Francis, H.-Y. Nie, A.R. Taylor, M.J. Walzak, W.H. Chang, D.F. MacFabe and W.M. Lau
    ToF-SIMS cluster ion imaging of Hippocampal rat brain neurons
    Appl. Surf. Sci. 255, 1126-1130 (2008).

    39. N.W. Ghonaim, M. Nieradko, L. Xi, H.-Y. Nie, J.T. Francis, O. Grizzi, K.K.C. Yeung and W.M. Lau
    Primary ion fluence dependence in time-of-flight SIMS of self-assembled monolayer of alkyl thiol molecules on Au (111) – discussion of static limit
    Appl. Surf. Sci. 255, 1029-1032 (2008).

    38. L. Xi, Z. Zheng, N.-S. Lam, H.-Y. Nie, O. Grizzi and W.M. Lau
    Study of the hyperthermal proton bombardment effects on self-assembled monolayers of dodecanethiol on Au(111)
    J. Phys. Chem. C 112, 12111-12115 (2008).

    37. M. Nieradko, N.W. Ghonaim, L. Xi, H.Y. Nie, J. Francis, O. Grizzi, K. Yeung and W.M. Lau
    Primary ion fluence dependence in time-of-flight SIMS of a self-assembled monolayer of octadecylphosphonic acid molecules on mica: discussion of static limit
    Can. J. Chem. 85, 1075-1082 (2007).

    36. H.-Y. Nie, N.S. McIntyre and W.M. Lau
    Nanolithography of a full-coverage octadecylphosphonic acid monolayer spin coated on a Si substrate
    Appl. Phys. Lett. 90, 203114 (2007).

    35. H.-Y. Nie, N.S. McIntyre and W.M. Lau
    Selective removal of octadecylphosphonic acid (OPA) molecules from their self-assembled monolayers (SAMs) formed on a Si substrate
    Journal of Physcis: Conference Series 61, 869-873 (2007).

    34. H.-Y. Nie and N.S. McIntyre
    Unstable amplitude and noisy image induced by tip contamination in dynamic force mode atomic force microscopy
    Rev. Sci. Instrum. 78, 023701 (2007).

    33. H.-Y. Nie, M.J. Walzak and N.S. McIntyre
    Growth and properties of complete monolayer films of octadecylphosphonic acid (OPA) on oxidized aluminum surfaces
    ATB Metallurgie 45, 564-568 (2006).

    32. H.-Y. Nie, M.J. Walzak and N.S. McIntyre
    Scratch resistance anisotropy in biaxially oriented polypropylene and poly(ethylene terephthalate) films
    Appl. Surf. Sci. 253, 2320-2326 (2006).

    31. J.T. Francis, H.-Y. Nie, N.S. McIntyre and D. Briggs
    ToF-SIMS investigation of octadecylphosphonic acid monolayers on a mica substrate
    Langmuir 22, 9244-9250 (2006).

    30. H.-Y. Nie, M.J. Walzak and N.S. McIntyre
    Delivering octadecylphosphonic acid self-assembled monolayers on a Si wafer and other oxide surfaces
    J. Phys. Chem. B 110, 21101-21108 (2006).

    29. N.S. McIntyre, H.-Y. Nie, A.P. Grosvenor, R.D. Davidson and D. Briggs
    XPS studies of octadecylphosphonic acid (OPA) monolayer interactions with some metal and mineral surfaces
    Surf. Interf. Anal. 37, 749-754 (2005).

    28. H.-Y. Nie, D.J. Miller, J.T. Francis, M.J. Walzak and N.S. McIntyre
    Robust self-assembled octadecylphosphonic acid monolayers on mica substrate
    Langmuir 21, 2773-2778 (2005).

    27. H.-Y. Nie, M.J. Walzak and N.S. McIntyre
    Atomic force microscopy study of biaxially-oriented polypropylene films
    J. Mater. Eng. Perform. 13, 451-460 (2004).

    26. H.-Y. Nie, M.J. Walzak and N.S. McIntyre
    Use of biaxially-oriented polypropylene film for evaluating and cleaning contaminated atomic force microscopy probe tips: an application to blind tip reconstruction
    Rev. Sci. Instrum. 73, 3831-3836 (2002).

    25. H.-Y. Nie, M.J. Walzak and N.S. McIntyre
    Bilayer and odd-numbered multilayers of octadecylphosphonic acid formed on Si substrate studied by atomic force microscopy
    Langmuir 18, 2955-2958 (2002).

    24. H.-Y. Nie and N.S. McIntyre
    A simple and effective method of evaluating atomic force microscopy tip performance
    Langmuir 17, 432-436 (2001).

    23. H.-Y. Nie
    Formation and decomposition of electron traps at hydrogneated Pd/GaAs (n-type) Schottky interfaces
    J. Appl. Phys. 87, 4327-4331 (2000).

    22. H.-Y. Nie, M.J. Walzak and N.S. McIntyre
    Atomic force microscopy study of UV/ozone treated polypropylene films
    Polymer Surface Modification: Relevance to Adhesion, Vol.2, Ed. K.L. Mittal, VSP (Utrecht, The Netherlands), 377-392 (2000).

    21. H.-Y. Nie, M.J. Walzak and N.S. McIntyre
    Draw-ratio-dependent morphology of biaxially-oriented polypropylene films as determined by atomic force microscopy
    Polymer 41, 2213-2218 (2000).

    20. H.-Y. Nie, M.J. Walzak, B. Berno and N.S. McIntyre
    Microscopic stripe formation and adhesion force increase introduced by local shear-stress deformation of polypropylene film
    Langmuir 15, 6484-6489 (1999).

    19. H.-Y. Nie, M.J. Walzak N.S. McIntyre and A.M. EL-Sherik
    Applications of lateral force imaging to enhance topographic features of polypropylene film and photo-cured polymers
    Appl. Surf. Sci. 144-145, 633-637 (1999).

    18. H.-Y. Nie, M.J. Walzak, B. Berno and N.S. McIntyre
    Atomic force microscopy study of polypropylene surfaces treated by UV and ozone: modification of morphology and adhesion force
    Appl. Surf. Sci. 144-145, 627-632 (1999).

    17. H.-Y. Nie and J. Masai
    Surface potentials on Pd/GaAs contacts studied using scanning probe microscopy
    Appl. Phys. A 66, s1059-s1062 (1998).

    16. H.-Y. Nie, K. Horiuchi, H. Yamauchi and J. Masai
    Local surface potential measurement of Pd/GaAs contact and anodized aluminum films using scanning probe microscopy
    Nanotechnology 8, A24-A31 (1997).

    15. H.-Y. Nie, M. Motomatsu, W. Mizutani and H. Tokumoto
    Observation of modification and recovery of local properties of polyethylene oxide
    J. Vac. Sci. Technol. B 15, 1388-1393 (1997).

    14. M. Motomatsu, T. Takahashi, H.-Y. Nie, W. Mizutani and H. Tokumoto
    Microstructure study of acrylic polymer-silica nanocomposite surface by scanning force microscopy
    Polymer 38, 177-182 (1997).

    13. M. Motomatsu, W. Mizutani, H.-Y. Nie and H. Tokumoto
    Surface structure of a fluorinated thiol on Au(111) by scanning force microscopy
    Thin Solid Films 281-282, 548-551 (1996).

    12. M. Motomatsu, H.-Y. Nie, W. Mizutani and H. Tokumoto
    Surface morphology study of poly (ethylene oxide) crystals by scanning force microscopy
    Polymer 37, 183-185 (1996).

    11. M. Motomatsu, H.-Y. Nie, W. Mizutani and H. Tokumoto
    Scanning force microscopy application to polymer surfaces for novel nano-scale surface characterization
    Thin Solid Films 273, 304-307 (1996).

    10. H.-Y. Nie, M. Motomatsu, W. Mizutani and H. Tokumoto
    Local elasticity measurement on polymers using atomic force microscopy
    Thin Solid Films 273, 143-148 (1996).

    9. H.-Y. Nie, M. Motomatsu, W. Mizutani and H. Tokumoto
    Local modification of elastic properties of polystyrene-polyethyleneoxide blend surfaces
    J. Vac. Sci. Technol. B 13, 1163-1166 (1995).

    8. M. Motomatsu, W. Mizutani, H.-Y. Nie and H. Tokumoto
    Lateral force measurements on phase separated polymer surfaces
    in Proceedings of Forces in Scanning Probe Microscopies, ASI E286, edited by H.-J. Guntherodt et al. (Kluwer Academic, Dordrecht, 1995), 331-336.

    7. M. Motomatsu, H.-Y. Nie, W. Mizutani and H. Tokumoto
    Local properties of phase-separated polymer surfaces by force microscopy
    Jpn. J. Appl. Phys. 33, Part 1, 3775-3778 (1994).

    6. H.-Y. Nie and Y. Nannichi
    Schottky and ohmic contacts of Pd on p-type GaAs distinguished with hydrogen
    J. Appl. Phys. 76, 4205-4208 (1994).

    5. H.Y. Nie, W. Mizutani and H. Tokumoto
    Au(111) reconstruction observed by atomic force microscopy with lateral force detection
    Surf. Sci. 311, L649-L654 (1994).

    4. H.Y. Nie, T. Shimizu and H. Tokumoto
    Atomic force microscopy study of Pd clusters on graphite and mica
    J. Vac. Sci. Technol. B 12, 1843-1846 (1994).

    3. H.-Y. Nie and Y. Nannichi
    Apparent recovery effect of hydrogenated Pd-on-GaAs (n-type) Schottky interface by forward current at low temperature
    Jpn. J. Appl. Phys. 32, Part 2, L890-L893 (1993).

    2. H.-Y. Nie and Y. Nannichi
    Pd-on-GaAs Schottky contact: Its barrier height and response to hydrogen
    Jpn. J. Appl. Phys. 30, Part 1, 906-913 (1991).

    1. T. Fukase, H.Y. Nie and Y. Nannichi
    Effect of stray carriers on the separation of electron and hole traps in TSC
    Jpn. J. Appl. Phys. 28, Part 1, 1515-1516 (1989).


Updated on January 14, 2012