Heng-Yong Nie, Ph.D.
Senior Research Scientist, Surface Science Western
Adjunct Research Professor, Department of Physics and Astronomy
The University of Western Ontario, London, Ontario, Canada

Ph.D. & M.Sc.: Univ. Tsukuba; B.Sc.: Univ. Electronic Sci. Technol. China


Specialied in surface analysis using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and scanning probe microscopy (SPM), I provide consultancy to industrial clients in areas related to surface/interface chemistry and metrology. To date, I have delivered over 2,000 confidential analytical reports to industrial clients, focusing on failure analysis and materials characterization across a wide range of sectors — including automotive coatings, semiconductors, nanotechnology, medical devices, polymers, and solid-state battery materials and electrodes.

One of my research interests is in developing ToF-SIMS analytical approaches, including data mining using principal component analysis (PCA), a dimensionality reduction technique. This facilitates a deeper understanding of surface/interface chemistry and aids in distinguishing between different chemical structures.

Having explored the formation mechanisms of self-assembled monolayers (SAMs) of organophosphonic acid (OPA) and organosilanes on oxides, as well as alkanethiols on metals, I introduced the concept of utilizing the potential energy on the surface of an OPA solution in a solvent with a dielectric constant of approximately 4, creating a kinetically and thermodynamically favorable environment for SAM formation on hydrophilic surfaces.


Recent Publications

Updated on April 13, 2025.