Heng-Yong Nie, Ph.D.
Research Scientist, Surface Science Western
Adjunct Research Professor, Department of Physics and Astronomy
The University of Western Ontario, London, Ontario, Canada

Ph.D. & M.Sc.: Univ. Tsukuba; B.Sc.: Univ. Electronic Sci. Technol. China


I am a materials scientist specializing in surface analysis using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and scanning probe microscopy (SPM). Besides providing analytical consultancy to industrial clients, I work on developing analytical approaches to exploring surface chemistry and chemical structures. I have also been working on developing new methodologies to understand formation mechanisms of self-assembly of organophosphonic acids monolayers and develop their applications in surface engineering in organic electronics and composite polymers.


Selected Publications

Updated on May 11, 2020.